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Chip probe test station

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/ One-stop solution for chip ATE testing.
/ Automatic testing.
/ Automatic sorting.
产品详情产品参数工作原理适用范围

Automatic testing can be carried out through the combination of the robot loading and unloading workstation:


·The robot picks up the chip from the tray with just the right amount of force and precise movements and places it stably in the tester.

·After the test is completed, the robot automatically takes out the chip and arranges it on a tray, reducing the uncertainty of material mixing when manually placing it in the tray due to human misoperation and ensuring that each handling is accurately placed in the designated position.

·Automatic handling avoids human contact and other situations in manual operation and reduces the risk of chip damage. The high-precision operation of the robot can ensure the accurate position of the chip in the tester, laying the foundation for accurate test results and thus improving the overall quality level of chip testing.


外形尺寸(mm)

Overall dimensions                                                                 L430*W300*H650

设备重量

Equipment weight                                                                  45kg

电源电压

Power supply voltage                                                            220V/50HZ

气源气压

Air source pressure                                           0.6MP

操作方式                                                                                  人机界面

Operation mode                                                                      human-machine interface

控制方式

Control mode                                                                           PLC

电机                                                                   伺服系统

motor                                                                 servo motor


Suitable for testing of semiconductor chips, probe cards (Probe Card), INK DIE, Flash, Sram, experimental probe cards, CMOS IMAGE SENSOR probe cards, etc.